Welcome to Shenzhen KINRI Energy Technology Co.,Ltd. official website!
Language：

Shenzhen KINRI Energy Technology Co.,Ltd.

SHENZHEN KINRI ENERGY

Huizhou (HK) Yingyuan Technology

Support Hotline

137-2371-6834 Timber (WhatsApp)

Shenzhen KINRI Energy Technology Co.,Ltd.
Knowledge
Current Location: Home > Knowledge > Knowledge

Knowledge

0755-29665062

Certificate

Shenzhen KINRI Energy Technology Co.,Ltd.
Knowledge

Standard specification requirements for low-temperature aging of power adapters

Article Source：Kinri Energy | Author：Kinri Energy | Issuing Time：2024.05.10
The purpose and process of low-temperature aging testing

During the production process of power adapters, after a certain period of use and storage, some components in the adapter circuit may experience aging, thereby affecting the quality and performance of the adapter. To ensure the quality and reliability of the product, it is necessary to conduct low-temperature aging tests on the power adapter.

Low temperature aging test is the process of placing the power adapter in a low-temperature environment for long-term startup testing. Normally, the temperature range for low-temperature aging testing is -20 ℃ to -40 ℃, and the testing time is usually 24 to 72 hours. During the testing period, it is necessary to monitor the circuit quality and performance of the power adapter.


48W Desktop Power Adapter

Requirements for low-temperature aging testing in international standards and industry norms

Both international standards and industry norms have requirements and regulations for low-temperature aging testing of power adapters.

1. International standard requirements

According to the international standard IEC 60068-2-1, for low-temperature aging testing, the testing temperature should be within the range of -25 ℃ to -40 ℃. During the testing period, it is necessary to monitor the circuit quality and performance of the power adapter, including circuit stability, power output performance, etc.

2. Industry regulatory requirements

The low-temperature aging test standard for power adapters also includes requirements in industry standards. For example, in the domestic electronics industry standard SJ/T11169-1998, there is a requirement for low-temperature aging testing of power adapters, with a temperature range of -20 ℃ to -35 ℃ and a testing period of generally 72 hours. The testing project mainly includes monitoring performance parameters such as power supply, output voltage, and output current.

Summary

The low-temperature aging test of power adapters can effectively verify the quality and reliability of products, and is a very important test in the manufacturing process of power adapters. When conducting low-temperature aging tests, it is necessary to strictly follow the requirements of international standards and industry norms to ensure the accuracy and reliability of the test results, and to ensure that the quality and performance of the power adapter meet the requirements.
Back List
Shenzhen KINRI Energy Technology Co.,Ltd.

Scan And Follow Us

  • Phone:+86-137-2371-6834 Timber (WhatsApp)
  • Tel:+86-0755-29665062
  • Email:mkt1@jinruipower.com
  • Add: No. 13A16 Huafeng International Commercial Building, No.4018 Bao’an Avenue, Xixiang, Baoan District, Shenzhen China
Copyright © 2009 Shenzhen KINRI Energy Technology Co.,Ltd. All Rights Reserved.
Clients: Mexican Telecom, ZTE, Mindray, Sony, Microsoft, Toshiba, Ohm Electronics, MT, MG and so on international famous brands